@article{paperid:1041288,
author = {Hamiyati Vaghef, Vahid and Peiravi, Ali},
title = {A graph based approach for reliability analysis of nano-scale VLSI logic circuits},
journal = {Microelectronics Reliability},
year = {2014},
volume = {54},
month = {May},
issn = {0026-2714},
pages = {1299--1306},
			numpages = {7},
keywords = {Reliability;Signal flow graph; Mason’s rule; Combinational logic; Probabilistic graph},
}