@article{paperid:1024290,
author = {Houshmand Kaffashian, Masaoud and Lotfi, Reza and Mafinezhad, Khlil and H. Mahmoodi},
title = {Impact of NBTI on performance of domino logic circuits in nano-scale CMOS},
journal = {Microelectronics Journal},
year = {2011},
volume = {42},
number = {12},
month = {December},
issn = {0026-2692},
pages = {1327--1334},
			numpages = {7},
keywords = {Keywords:
Dynamic logic
Negative bias temperature instability
(NBTI)
Reliability},
}