@article{paperid:1033463,
author = {Houshmand Kaffashian, Masaoud and Lotfi, Reza and Mafinezhad, Khlil and Hamid Mahmoodi},
title = {Impacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS},
journal = {Microelectronics Reliability},
year = {2012},
volume = {52},
number = {8},
month = {August},
issn = {0026-2714},
pages = {1655--1659},
			numpages = {4},
keywords = {Negative-bias temperature instability (NBTI); positive-bias temperature instability (PBTI); high-k metal-gate; reliability},
}