@article{paperid:1100428,
author = {Esmaieli Sartakhti, Esfandiar and Sedaghat, Yasser and Peiravi, Ali},
title = {Fanout-Based Reliability Model for SER Estimation in Combinational Circuits},
journal = {IEEE Transactions on Circuits and Systems Part I: IRegular Papers},
year = {2024},
volume = {72},
number = {1},
month = {January},
issn = {1549-8328},
pages = {228--240},
			numpages = {12},
keywords = {Single event transient; single event rate; signal probability; logic circuit; logical masking; electrical masking; combinational circuits.},
}