%0 Journal Article
%T Impacts of NBTI/PBTI on performance of domino logic circuits with high-k metal-gate devices in nanoscale CMOS
%A Houshmand Kaffashian, Masaoud
%A  Lotfi, Reza
%A  Mafinezhad, Khlil
%A  Hamid Mahmoodi
%J Microelectronics Reliability
%@ 0026-2714
%D 2012