%0 Journal Article
%T Application of a Scanning Thermal Nano-Probe for Thermal Imaging of High Frequency Active devices
%A Joodaki, Mojtaba
%A  Pawel Janus
%A  Teodor Gotszalk
%A  Günter Kompa
%A  Klaus Edinger
%A  Ivo W.  Rangelow
%J Japanese Journal of Applied Physics
%@ 0021-4922
%D 2005