Title : ( A low-complexity digital background calibration of sample-time error in time-interleaved A/D converters )
Authors: amir Bazrafshan , Mohammad Taherzadeh-Sani , Frederic Nabki ,Access to full-text not allowed by authors
Abstract
A digital background calibration technique to estimate the sample-time error (timing-skew) in timeinterleaved ADCs is presented. Compared to the state-ofthe- art, this technique requires a simpler digital block and, hence, a lower power dissipation. The proposed technique detects timing skew for each channel by means of finding zero-crossing samples with respect to a reference comparator. Simulation results show that it can effectively correct timing errors for any type of input signal up to Nyquist, and achieves a high convergence speed with a very low computational complexity.
Keywords
, Time-interleaved ADC, Sample-time error Background calibration, Zero-crossing@article{paperid:1036094,
author = {Bazrafshan, Amir and Taherzadeh-Sani, Mohammad and Frederic Nabki},
title = {A low-complexity digital background calibration of sample-time error in time-interleaved A/D converters},
journal = {Analog Integrated Circuits And Signal Processing},
year = {2013},
volume = {76},
number = {2},
month = {August},
issn = {0925-1030},
pages = {245--249},
numpages = {4},
keywords = {Time-interleaved ADC; Sample-time error Background calibration; Zero-crossing},
}
%0 Journal Article
%T A low-complexity digital background calibration of sample-time error in time-interleaved A/D converters
%A Bazrafshan, Amir
%A Taherzadeh-Sani, Mohammad
%A Frederic Nabki
%J Analog Integrated Circuits And Signal Processing
%@ 0925-1030
%D 2013