Title : ( Comparison of Electron Scattering Mechanisims and Electron Mobility in AlN and GaN at Low Electric Field Application )
Authors: A. Vatan-khahan , M. H . Tayarani , A. Sadremomtaz , Hadi Arabshahi ,Access to full-text not allowed by authors
Abstract
Iterative technique is used to solve Boltzmann transport equation in bulk wurtzite phase GaN and AlN at central valley conduction band. The electron mobility is calculated as a function of temperature and ionized- impurity in the ranges of 100 K to 600 K and 1016 to 1018 cm-3. The theoretical maximum motilities in GaN and AlN at 300 K are about 1100 and 380 cm2.V-1s-1. We compare the results with experimental data and find reasonable correlation.
Keywords
Iteration Model; ionized impurity scattering;@article{paperid:1023143,
author = {A. Vatan-khahan and M. H . Tayarani and A. Sadremomtaz and Arabshahi, Hadi},
title = {Comparison of Electron Scattering Mechanisims and Electron Mobility in AlN and GaN at Low Electric Field Application},
journal = {International Journal of Science and Advanced Technology},
year = {2011},
volume = {1},
number = {5},
month = {July},
issn = {2221-8386},
pages = {116--119},
numpages = {3},
keywords = {Iteration Model; ionized impurity scattering;},
}
%0 Journal Article
%T Comparison of Electron Scattering Mechanisims and Electron Mobility in AlN and GaN at Low Electric Field Application
%A A. Vatan-khahan
%A M. H . Tayarani
%A A. Sadremomtaz
%A Arabshahi, Hadi
%J International Journal of Science and Advanced Technology
%@ 2221-8386
%D 2011