Title : ( Small-Signal Characterization of SiGe-HBT<tex>$f_T$</tex>-Doubler up to 120 GHz )
Authors: Mojtaba Joodaki ,Access to full-text not allowed by authors
Abstract
In this brief, small-signal characterizations of selectively implanted collector (SIC) and non-SIC SiGe-heterojunction bipolar transistors (HBT) fT-doublers up to 120 GHz are measured, analyzed, and compared with those of the corresponding single devices. The measured results confirm a great improvement in transit frequency with almost no considerable decrease in the maximum stable gain/maximum available gain, and maximum oscillation frequency. Since the fT-doubler can be used easily instead of a single transistor, a much higher transit frequency and RF power can be achieved while using a technology with a moderate fT.
Keywords
, ft-doubler, S-parameter measurements, SiGe-HBT, transit frequency@article{paperid:1037011,
author = {Joodaki, Mojtaba},
title = {Small-Signal Characterization of SiGe-HBT<tex>$f_T$</tex>-Doubler up to 120 GHz},
journal = {IEEE Transactions on Electron Devices},
year = {2005},
volume = {52},
number = {9},
month = {September},
issn = {0018-9383},
pages = {2108--2111},
numpages = {3},
keywords = {ft-doubler; S-parameter measurements; SiGe-HBT; transit frequency},
}
%0 Journal Article
%T Small-Signal Characterization of SiGe-HBT<tex>$f_T$</tex>-Doubler up to 120 GHz
%A Joodaki, Mojtaba
%J IEEE Transactions on Electron Devices
%@ 0018-9383
%D 2005