IEEE Transactions on Very Large Scale Integration (VLSI) Systems, ( ISI ), Volume (23), No (9), Year (2015-9) , Pages (1914-1919)

Title : ( A 350-MS/s Continuous-Time Delta–Sigma Modulator With a Digitally Assisted Binary-DAC and a 5-Bits Two-Step-ADC Quantizer in 130-nm CMOS )

Authors: Mohammad Taherzadeh-Sani , Frederic Nabki ,
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Abstract

Two techniques to improve the performance of continuous-time delta–sigma (CTDS) modulators are presented. A digital calibration technique is introduced to enable the use of binary current digital-to-analog converters (DACs) without dynamic element matching. Furthermore, a high-speed two-step analog-to-digital data converter quantizer is introduced to efficiently increase the resolution of the quantizer in CTDS modulators with high-sampling rates. A proof-of-concept prototype implemented in 130-nm CMOS shows that the proposed calibration technique can compensate for up to 5% of mismatch in the DAC elements. The modulator has a measured SNDR/SFDR of 60.3/74 dB for a sampling rate of 350 MS/s and oversampling ratio of 20, translating to an 8.75-MHz bandwidth. The total power consumption is 5.5 mW from a 1.6 V supply.

Keywords

, Continuous-time, delta–sigma modulator, self-calibration, two-step analog-to-digital data converter (ADC).
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@article{paperid:1052979,
author = {Taherzadeh-Sani, Mohammad and Frederic Nabki},
title = {A 350-MS/s Continuous-Time Delta–Sigma Modulator With a Digitally Assisted Binary-DAC and a 5-Bits Two-Step-ADC Quantizer in 130-nm CMOS},
journal = {IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
year = {2015},
volume = {23},
number = {9},
month = {September},
issn = {1063-8210},
pages = {1914--1919},
numpages = {5},
keywords = {Continuous-time; delta–sigma modulator; self-calibration; two-step analog-to-digital data converter (ADC).},
}

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%0 Journal Article
%T A 350-MS/s Continuous-Time Delta–Sigma Modulator With a Digitally Assisted Binary-DAC and a 5-Bits Two-Step-ADC Quantizer in 130-nm CMOS
%A Taherzadeh-Sani, Mohammad
%A Frederic Nabki
%J IEEE Transactions on Very Large Scale Integration (VLSI) Systems
%@ 1063-8210
%D 2015

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