To achieve high-quality in low-dimensional layered van der Waals materials, microcrystals are typically exfoliated. The small size of exfoliated flakes makes their optical characterization with conventional far-field optics challenging. Thus, flake-characterization has typically required delicate spatial scanning via a near-field tip. We present a simple method for determining the optical properties of optically small flakes. Our method is based on far-field spectroscopy and requires minimal numerical fitting. We demonstrate the robustness of our method using hexagonal boron nitride and a-MoO3.

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