Journal of Applied Sciences, ( ISI ), Volume (9), No (16), Year (2009-7) , Pages (2941-2947)

Title : ( Redundancy for Reliability Growth of Electronic Systems under Various Operating Conditions )

Authors: Ali Peiravi ,

Citation: BibTeX | EndNote

Reliability analysis of sophisticated electronic systems is usually performed based on the most common approaches available, namely the state space approach and the reliability block diagram (RBD) approach. The expected operating conditions of the system also play an important role in the analysis of the reliability of the system since they affect its mean lifetime. In this study, redundancy is proposed as a means of reliability growth in the absence of other possible means to achieve this goal. To show this in the form of a case study, state space and RBD reliability modeling are used for the analysis of the reliability of a specific navigation and guidance system in various operating conditions. The growth in reliability is indicated by designing in redundancy and the reliability of the system is shown to be effectively improved where none of the other viable measures are available to us. Measures of reliability such as MTTF, MTTR, and availability are estimated under various system operating conditions.

Keywords

, Mean time to failure, Mean time to repair, availability, RBD, state space,
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@article{paperid:1011029,
author = {Peiravi, Ali},
title = {Redundancy for Reliability Growth of Electronic Systems under Various Operating Conditions},
journal = {Journal of Applied Sciences},
year = {2009},
volume = {9},
number = {16},
month = {July},
issn = {1812-5654},
pages = {2941--2947},
numpages = {6},
keywords = {Mean time to failure; Mean time to repair; availability; RBD; state space; redundancy},
}

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%0 Journal Article
%T Redundancy for Reliability Growth of Electronic Systems under Various Operating Conditions
%A Peiravi, Ali
%J Journal of Applied Sciences
%@ 1812-5654
%D 2009

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