Title : ( A Low-Cost Fault-Tolerant Technique for Carry Look-Ahead Adder )
Authors: Alireza Namazi , Yasser Sedaghat , Seyed Ghassem Miremadi , Alireza Ejlali ,
Full TextAbstract
This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that this adder corrects all single-bit and multiple-bit transient faults. The Power-Delay Product (PDP) and area overheads of this technique are decreased at least 82% and 71%, respectively, as compared to adders which use traditional TMR, parity prediction, and duplication techniques.
Keywords
, Carry Look-Ahead Adder, Fault Tolerance, Single-Event Transient
@inproceedings{paperid:1026821,
author = {Alireza Namazi and Sedaghat, Yasser and Seyed Ghassem Miremadi and Alireza Ejlali},
title = {A Low-Cost Fault-Tolerant Technique for Carry Look-Ahead Adder},
booktitle = {the 15th IEEE International On-Line Testing Symposium - IOLTS’09},
year = {2009},
location = {Sesimbra-Lisbon},
keywords = {Carry Look-Ahead Adder; Fault Tolerance; Single-Event Transient},
}
%0 Conference Proceedings
%T A Low-Cost Fault-Tolerant Technique for Carry Look-Ahead Adder
%A Alireza Namazi
%A Sedaghat, Yasser
%A Seyed Ghassem Miremadi
%A Alireza Ejlali
%J the 15th IEEE International On-Line Testing Symposium - IOLTS’09
%D 2009
