the 15th IEEE International On-Line Testing Symposium - IOLTS’09 , 2009-06-24
Title : ( A Low-Cost Fault-Tolerant Technique for Carry Look-Ahead Adder )
Authors: Alireza Namazi , Yasser Sedaghat , Seyed Ghassem Miremadi , Alireza Ejlali ,File:
Full Text

Abstract
This paper proposes a low-cost fault-tolerant Carry Look-Ahead (CLA) adder which consumes much less power and area overheads in comparison with other fault-tolerant CLA adders. Analytical and experimental results show that this adder corrects all single-bit and multiple-bit transient faults. The Power-Delay Product (PDP) and area overheads of this technique are decreased at least 82% and 71%, respectively, as compared to adders which use traditional TMR, parity prediction, and duplication techniques.