This investigation concentrates on the combined effect of mechanical shock and electrostatic loads on the dynamic pull-in instability of functionally graded micro-beams. An alternative reduced order model (ROM) is employed to study the pull-in behavior. The accuracy of the model is validated through comparison of the presented results with the six-mode Galerkin approximations published in the literature. The effect of using functionally graded materials in the micro-beam is also studied. The pull-in voltage of micro-beam is calculated in presence and absence of modified couple stress theory.

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