An International Conference in Honour of N. Balakrishnan for his 60th Birthday: Ordered Data and their Applications in Reliability and Survival Analysis , 2016-08-07

Title : ( Goodness-of-Fit test based on cumulative Kullback-Leibler information for progressively type-II censored data )

Authors: Arezou Habibirad ,

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Goodness-of-fit procedures have been developed in the literature for the cases when the available samples are censored. Recently, a more exible and efficient form of censoring, called progressive censoring, has been studied. In this paper, we construct a goodness-of-fit test statisttic based on cumulative Kullback-Leibler information (Baratpour and Habibi Rd, 2014) for Weibull distribution by using max- imum likelihood estimates of the model parameters. Finally, we use Monte Carlo simulation to evaluate the power of the proposed test for several alternatives under different sample sizes and progressive censoring schemes. Also, the results are compared with the goodness-of-fit test introduced by Habibi Rad et al. (2011). The use of the proposed test is shown in an illustrative example.

Keywords

, Cumulative Kullback, Leibler information; Progressively type, II censored data; Weibull distribution; Maximum likelihood estimators; Power
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@inproceedings{paperid:1054861,
author = {Habibirad, Arezou},
title = {Goodness-of-Fit test based on cumulative Kullback-Leibler information for progressively type-II censored data},
booktitle = {An International Conference in Honour of N. Balakrishnan for his 60th Birthday: Ordered Data and their Applications in Reliability and Survival Analysis},
year = {2016},
location = {همیلتون},
keywords = {Cumulative Kullback-Leibler information; Progressively type- II censored data; Weibull distribution; Maximum likelihood estimators; Power study.},
}

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%0 Conference Proceedings
%T Goodness-of-Fit test based on cumulative Kullback-Leibler information for progressively type-II censored data
%A Habibirad, Arezou
%J An International Conference in Honour of N. Balakrishnan for his 60th Birthday: Ordered Data and their Applications in Reliability and Survival Analysis
%D 2016

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