Title : ( Exponential goodness of fit test based on Lin-Wong divergence on type-I censored data )
Authors: ALIREZA PAKGOHAR , Arezou Habibirad , F. Yousefzadeh ,
Full TextAbstract
Goodness of fit tests provides guidance for evaluating the suitability of a potential input model. Exponential testing in goodness of fit test field has long been an interesting issue in statistical inferences. This paper presents the Lin-Wong divergence as our proposed measure of distance between distributions and compared its powerful with that of other well-known distance measures using the empirical distribution function and Shannon entropy concept such as Anderson-Darling, Cramer-von Misses, Kolmogorov-Smirnov and Kullback-Leibler. Finally, the use of proposed test is shown in an illustrative example
Keywords
, Anderson-Darling, Goodness of fit test, Lin Wong divergence, Exponential distribution, Type-I censored scheme.
@inproceedings{paperid:1070018,
author = {PAKGOHAR, ALIREZA and Habibirad, Arezou and F. Yousefzadeh},
title = {Exponential goodness of fit test based on Lin-Wong divergence on type-I censored data},
booktitle = {سومین کارگاه اندازه های اطلاعات و کاربردهای آن},
year = {2018},
location = {مشهد, IRAN},
keywords = {Anderson-Darling; Goodness of fit test; Lin Wong divergence; Exponential distribution; Type-I censored scheme.},
}
%0 Conference Proceedings
%T Exponential goodness of fit test based on Lin-Wong divergence on type-I censored data
%A PAKGOHAR, ALIREZA
%A Habibirad, Arezou
%A F. Yousefzadeh
%J سومین کارگاه اندازه های اطلاعات و کاربردهای آن
%D 2018
