IEEE Transactions on Instrumentation and Measurement, Volume (74), Year (2025-1) , Pages (1-9)

Title : ( Analysis of Integrator-Differentiator Transimpedance Amplifiers: Speed and Gain Tradeoff Introduced by Parasitic Capacitances )

Authors: Mehdi Saberi , Chan Cao , Alexandre Schmid ,

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Abstract

In this article, the frequency behavior and stability of current recording systems employing continuous-time (CT) integrator-differentiator transimpedance amplifiers (TIAs) are analyzed. The proposed comprehensive analysis provides designers with helpful design rules and the ability to better predict the behavior of each individual block as well as the overall circuit; moreover, it demonstrates that the overall TIA circuit suffers from stability issues introduced by parasitic capacitances, which the designers may underestimate its importance. This leads to a tradeoff between the speed and gain of the TIA circuit. In addition, it is shown that using a differential-output structure improves the stability issues caused by the parasitic capacitances. The simulation and measurement results of a prototype circuit implemented in a 180-nm CMOS technology verify the effectiveness of the proposed analysis.

Keywords

, Differentiator, integrator, speed-gain tradeoff, stability, transimpedance amplifier (TIA).
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@article{paperid:1106410,
author = {Saberi, Mehdi and چان کائو and الکساندر اشمید},
title = {Analysis of Integrator-Differentiator Transimpedance Amplifiers: Speed and Gain Tradeoff Introduced by Parasitic Capacitances},
journal = {IEEE Transactions on Instrumentation and Measurement},
year = {2025},
volume = {74},
month = {January},
issn = {0018-9456},
pages = {1--9},
numpages = {8},
keywords = {Differentiator; integrator; speed-gain tradeoff; stability; transimpedance amplifier (TIA).},
}

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%0 Journal Article
%T Analysis of Integrator-Differentiator Transimpedance Amplifiers: Speed and Gain Tradeoff Introduced by Parasitic Capacitances
%A Saberi, Mehdi
%A چان کائو
%A الکساندر اشمید
%J IEEE Transactions on Instrumentation and Measurement
%@ 0018-9456
%D 2025

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